Transmission electron microscopy : physics of image formation
Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated. Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text
Springer series in optical sciences, v. 36, 36
1 online resource (xvi, 587 pages) : illustrations
9780387347585, 9780387400938, 0387347585, 0387400931
317883301
Introduction
Particle optics of electrons
Wave optics of electrons
Elements of a transmission electron microscope
Electron-specimen interactions
Scattering and phase contrast for amorphous specimens
Theory of electron diffraction
Electron-diffraction modes and applications
Imaging of crystalline specimens and their defects
Elemental analysis by X-ray and election energy-loss spectroscopy
Specimen damage by electron irradiation
English