Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
1 online resource
9780387857305, 9780387857312, 0387857303, 0387857311
1012567001
Available in another form:
Sample collection and selection
Sample preparation tools
Sample support
Sample Embedding and Mounting
Sample Exposure
Sample Dehydration
Sample Stabilization for Imaging in the SEM
Sample Stabilization to Preserve Chemical Identity
Sample cleaning
Sample Surface Charge Elimination
Sample Artifacts and Damage
Additional Sources of Information