Transmission Electron Microscopy: Physics of Image Formation

Przednia okładka
Springer Science & Business Media, 28 sie 2008 - 590
The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.
 

Spis treści

Introduction
1
Particle Optics of Electrons 17
16
35
Wave Optics of Electrons
45
Elements of a Transmission Electron Microscope
77
ElectronSpecimen Interactions
134
Scattering and Phase Contrast for Amorphous
195
Theory of Electron Diffraction 273
272
Imaging of Crystalline Specimens and Their Defects
359
Elemental Analysis by Xray and Electron EnergyLoss
419
Correction
431
Spectroscopic Imaging
448
Specimen Damage by Electron Irradiation
459
References
491
Index
575
Prawa autorskie

ElectronDiffraction Modes and Applications
329

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