Transmission Electron Microscopy: Physics of Image FormationSpringer Science & Business Media, 28 sie 2008 - 590 The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics. |
Spis treści
Introduction | 1 |
Particle Optics of Electrons 17 | 16 |
པ | 35 |
Wave Optics of Electrons | 45 |
Elements of a Transmission Electron Microscope | 77 |
ElectronSpecimen Interactions | 134 |
Scattering and Phase Contrast for Amorphous | 195 |
Theory of Electron Diffraction 273 | 272 |
Imaging of Crystalline Specimens and Their Defects | 359 |
Elemental Analysis by Xray and Electron EnergyLoss | 419 |
Correction | 431 |
Spectroscopic Imaging | 448 |
Specimen Damage by Electron Irradiation | 459 |
References | 491 |
575 | |
ElectronDiffraction Modes and Applications | 329 |
Inne wydania - Wyświetl wszystko
Transmission Electron Microscopy: Physics of Image Formation Ludwig Reimer,Helmut Kohl Ograniczony podgląd - 2008 |
Transmission Electron Microscopy: Physics of Image Formation Ludwig Reimer,Helmut Kohl Podgląd niedostępny - 2010 |
Kluczowe wyrazy i wyrażenia
amplitude angular astigmatism atoms axis Bloch waves Bragg reflections bright-field calculated carbon cathode chromatic aberration cross section crystal dark-field decrease defocusing density detector diameter diaphragm diffraction pattern dislocation edge EELS elastic electron beam electron diffraction electron energy electron energy-loss Electron Microscopy electron probe emission energy loss equation example excitation field filter foil Fourier transform Fresnel fringes function high resolution holography increasing inelastic scattering intensity distribution ionization irradiated Kikuchi layer lenses magnetic mass thickness method micrographs Microsc mode mrad objective lens observed obtained optical Optik particles phase contrast phase shift Philos Phys plasmon plasmon losses primary beam radiation damage reciprocal lattice Reimer scanning scattered electrons scattering angles Sect spatial frequencies specimen spectrum spherical aberration STEM structure surface temperature theory thin tilt transmission electron transmission electron microscope Ultramicroscopy unit cell values vector voltage x-ray