Electron Backscatter Diffraction in Materials ScienceAdam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field Springer Science & Business Media, 29 cze 2013 - 339 Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM). |
Spis treści
1 | |
1 | 9 |
THEORETICAL FRAMEWORK FOR ELECTRON BACKSCATTER | 16 |
3 | 23 |
5 | 30 |
2 | 40 |
7 | 47 |
3 | 53 |
USE OF EBSD DATA IN MESOSCALE NUMERICAL ANALYSES | 181 |
CHARACTERIZATION OF DEFORMED MICROSTRUCTURES | 199 |
ANISOTROPIC PLASTICITY MODELING INCORPORATING EBSD | 213 |
76 | 222 |
MEASURING STRAINS USING ELECTRON BACKSCATTER | 231 |
78 | 238 |
MAPPING RESIDUAL PLASTIC STRAIN IN MATERIALS USING | 247 |
88 | 249 |
7 | 61 |
6 | 71 |
3 | 78 |
5 | 84 |
8 | 91 |
BUYING A SYSTEM | 123 |
AN AUTOMATED EBSD ACQUISTION AND PROCESSING SYSTEM | 135 |
ADVANCED SOFTWARE CAPABILITIES FOR AUTOMATED EBSD | 141 |
75 | 150 |
STRATEGIES FOR ANALYZING EBSD DATASETS | 153 |
EBSD CONTRA TEM CHARACTERIZATION OF A DEFORMED | 265 |
91 | 272 |
CONTINUOUS RECRYSTALLIZATION AND GRAIN BOUNDARIES | 277 |
ANALYSIS OF FACETS AND OTHER SURFACES USING | 291 |
EBSD OF CERAMIC MATERIALS | 299 |
GRAIN BOUNDARY CHARACTER BASED DESIGN | 319 |
92 | 323 |
337 | |
Inne wydania - Wyświetl wszystko
Electron Backscatter Diffraction in Materials Science Adam J. Schwartz,Mukul Kumar,Brent L. Adams,David P. Field Ograniczony podgląd - 2000 |
Electron Backscatter Diffraction in Materials Science Adam J. Schwartz,Mukul Kumar,Brent L. Adams,David P. Field Ograniczony podgląd - 2010 |
Electron Backscatter Diffraction in Materials Science Adam J. Schwartz,Mukul Kumar,Brent L. Adams,David Field Podgląd niedostępny - 2009 |
Kluczowe wyrazy i wyrażenia
Alloy analysis angle boundaries angular deviation annealing applications automated EBSD axes backscatter Kikuchi beam calculated camera ceramics characterization components compression correlation crystal orientation crystallographic cubic determined diffraction pattern Dingley direction dislocation cell EBSD data EBSD patterns EBSD system EBSD technique electron backscatter diffraction Euler angles film fraction function fundamental zone gradient grain boundary grain orientation Hough transform identified image quality indexing interface intergranular Juul Jensen Kikuchi bands Kikuchi patterns lattice orientation layer Materials Science method microscope microstructure misorientation angle misorientation density obtained orientation map orientation measurements parameters pattern quality phase identification pixel plane plastic strain pole figures polycrystalline polycrystals processing Radon transform Randle recrystallization region sample scanning electron scanning electron microscope Schwarzer shown in Figure shows simulations single crystal slip systems space spatial resolution stress structure substrate superconducting symmetry tantalum tensile texture tilt triple junctions vector x-ray YBCO zirconium zone axis