Principles and Practice of Variable Pressure / Environmental Scanning Electron Microscopy (VP-ESEM)John Wiley & Sons, 20 lis 2008 - 240
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Spis treści
1 | |
2 Principles of SEM | 17 |
3 General Principles of VPESEM Utilising a Gas | 63 |
4 Imaging and Analysis in VPESEM The Influence of a Gas | 93 |
5 Imaging Uncoated Specimens in the VPESEM | 131 |
6 A Lab in a Chamberin situ Methods in VPESEM and Other Applications | 169 |
215 | |
Inne wydania - Wyświetl wszystko
Principles and Practice of Variable Pressure / Environmental Scanning ... Debbie Stokes Ograniczony podgląd - 2008 |
Principles and Practice of Variable Pressure / Environmental Scanning ... Debbie Stokes Podgląd niedostępny - 2008 |
Principles and Practice of Variable Pressure / Environmental Scanning ... Debbie Stokes Podgląd niedostępny - 2008 |
Kluczowe wyrazy i wyrażenia
anode aperture argon atomic number backscattered electrons beam current beam energy E0 beam skirt carbon cathodoluminescence Chapter conduction band contrast Danilatos depth distance effects elastic mean free elastic scattering electric field electron imaging emitted energy gap environmental scanning electron Equation ESEM example FEI Company focused probe function gas path length gaseous gases gibbsite helium hence high-vacuum Horizontal field width hydrated imaging gas increase inelastic insulating interaction volume ionisation liquid materials mean free path Microsc minimise negative charge nitrogen objective lens particles path length GPL Phillips photon Phys plot polymer positive ions pressure scanning electron pressure-limiting differential primary beam energy primary electron beam primary electron scattering radiation damage range region sample Scanning Electron Microscopy secondary electron secondary electron signal Section shown in Figure shows skirt radius specimen surface Stokes surface potential temperature Thiel torr Toth vacuum valence band VP-ESEM water vapour water vapour pressure X-ray microanalysis