Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas

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Channing C. Ahn
John Wiley & Sons, 6 mar 2006 - 472
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This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.
 

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Spis treści

1 Introduction
1
2 Experimental Techniques and Instrumentation
21
3 EELS Quantitative Analysis
49
4 Energy Loss Fine Structure
97
5 Energy Filtered Diffraction
127
6 Elemental Mapping Using Energy Filtered Imaging
159
7 Probing Materials Chemistry Using ELNES
223
8 Application to Ceramics Catalysts and Transition Metal Oxides
271
9 EELS of the Electronic Structure and Microstructure of Metals
317
10 Electron Energy Loss Studies in Semiconductors
353
11 Electron Energy Loss Spectroscopy of Magnetic Materials
385
12 Electron Energy Loss Spectroscopy of Polymers
419
Index
455
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Informacje o autorze (2006)

Channing C. Ahn earned his PhD in Physics at the University of Bristol, UK, in 1986. He is presently a Professor at the California Institute of Technology.

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