Cost Analysis Of Electronic Systems (Second Edition)World Scientific, 15 gru 2016 - 576 This book provides an introduction to the cost modeling for electronic systems that is suitable for advanced undergraduate and graduate students in electrical, mechanical and industrial engineering, and professionals involved with electronics technology development and management. This book melds elements of traditional engineering economics with manufacturing process and life-cycle cost management concepts to form a practical foundation for predicting the cost of electronic products and systems. Various manufacturing cost analysis methods are addressed including: process-flow, parametric, cost of ownership, and activity based costing. The effects of learning curves, data uncertainty, test and rework processes, and defects are considered. Aspects of system sustainment and life-cycle cost modeling including reliability (warranty, burn-in), maintenance (sparing and availability), and obsolescence are treated. Finally, total cost of ownership of systems, return on investment, cost-benefit analysis, and real options analysis are addressed. |
Spis treści
| 1 | |
Part I Manufacturing Cost Modeling | 15 |
Part II LifeCycle Cost Modeling | 239 |
Appendix A Notation | 503 |
Appendix B Weighted Average Cost of Capital WACC | 523 |
Appendix C DiscreteEvent Simulation DES | 533 |
| 543 | |
Inne wydania - Wyświetl wszystko
Cost Analysis of Electronic Systems (Second, Updated and Expanded Edition) Peter Sandborn Podgląd niedostępny - 2016 |
Kluczowe wyrazy i wyrażenia
activity Activity-Based Costing analysis Assume availability Black-Scholes burn-in calculation Chapter chip circuit COCOMO computed cost estimation cost modeling cost of ownership Ctest cumulative average defect density design refresh determine devices under test diagnosis discount rate distribution effective cost engineering Equation equipment exponential distribution fabrication failure rate false positives fault coverage flip chip fraction given inputs inventory investment labor learning curve life-cycle cost machine Monte Carlo Monte Carlo analysis MTBF number of failures number of units obsolescence operational overhead parameters perform predictive predictive maintenance printed circuit board probability problem process flow process step product instance purchase quantity random number reliability repair replacement result rework sample scrapped shown in Figure Table test step tester total cost total number variable WACC wafer warranty warranty claims warranty period Weibull distribution yield model yielded cost