Transmission Electron Microscopy: A Textbook for Materials Science, Tom 2

Przednia okładka
Springer Science & Business Media, 31 lip 2009 - 775

This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.

 

Spis treści

Part 1 Basics
2
The Transmission Electron Microscope
3
Scattering and Diffraction
23
Elastic Scattering
39
Inelastic Scattering and Beam Damage
53
Electron Sources
73
Lenses Apertures and Resolution
91
How to See Electrons
115
Part 3 Imaging
369
Amplitude Contrast
371
PhaseContrast Images
389
Thickness and Bending Effects
407
Planar Defects
419
Imaging Strain Fields
441
WeakBeam DarkField Microscopy
463
HighResolution TEM
483

Pumps and Holders
127
The Instrument
141
Specimen Preparation
173
Part 2 Diffraction
194
Diffraction in TEM
197
Thinking in Reciprocal Space
211
Diffracted Beams
221
Bloch Waves
235
Dispersion Surfaces
245
Diffraction from Crystals
257
Diffraction from Small Volumes
271
Obtaining and Indexing ParallelBeam Diffraction Patterns
283
Kikuchi Diffraction
311
Obtaining CBED Patterns
323
Using ConvergentBeam Techniques
347
Other Imaging Techniques
511
Image Simulation
533
Processing and Quantifying Images
549
Part 4 Spectrometry
580
Xray Spectrometry
581
Xray Spectra and Images
605
Qualitative Xray Analysis and Imaging
625
Quantitative Xray Analysis
639
Spatial Resolution and Minimum Detection
663
Electron EnergyLoss Spectrometers and Filters
679
LowLoss and NoLoss Spectra and Images
699
High EnergyLoss Spectra and Images
715
Fine Structure and Finer Details
741
Index
1-1
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